Description
The high performance LAMBDA 1050+ offers unmatched flexibility by providing you the choice to configure systems to suit your needs. From selection of detectors to accessories that provide the most convenient and flexible approach to sampling than any other UV/Vis/NIR system available.
Better Sample Control
The LAMBDA 1050+ has been designed with a host of features and accessories to control your sample and ensure the quality of your data, including:
The industry’s largest sample compartments for more sample maneuverability and quick installation of various accessories
Snap-in integrating spheres to capture diffuse and specular reflectance. Available in 100 and 150 mm, with 8° reflectance and center mount capability
Universal Reflectance Accessory with dual Si and InGaAs detectors for automated, precise and reproducible angle adjustments
Pol/Depol Drive Unit for automatic control of polarized or depolarized light via PC
Internal instrument-controlled attenuation from 1 to 0.1%, for high absorbing measurements
Smarter Flexibility
The smart modular design of LAMBDA 1050+ together with a range of snap-in accessories allow you to set up the instrument to suit a variety of needs and configurations, including:
Dual Sampling Compartment – The LAMBDA 1050+ can be configured with two large sampling compartments for twice the flexibility. Use one for standard reflectance or transmission tests, and the other for more specific customizable applications
Universal Reflectance Accessory – Remove the standard detector and snap in this innovative accessory for automatically measuring sample angles
Total Absolute Measurement System - The Total Absolute Measurement System (TAMS) provides the highest degree of flexibility and accuracy in measuring specular, as well as diffuse transmission, and reflectance capabilities, with upgradeable detector configuration
General-Purpose Optical Bench – Swap in our GPOB to accommodate larger samples such as lenses, beamsplitters and optics
Greater Productivity
Faster results - With its high sensitivity, the new LAMBDA 1050+ can scan faster than ever with no reduction in data quality – up to 2.25 times faster Simple Scan and 40% faster Full Scan rates than older versions
Higher sensitivity - Double mirrors that offer better signal for greater sensitivity to accurately characterize your samples
Reduced Setup Time – With the industry’s lowest instrument setup and sampling setup time, the lightning fast LAMBDA 1050+ is quicker than ever. It allows you to not only go where you’ve never gone before, but you can get there the fastest way possible! We also offer a standard validation kit for all of our LAMBDA spectrophotometers.
Software
Unleash the power of your LAMBDA 1050+ UV/Vis/NIR spectrophotometer with UV WinLab software designed for operational simplicity and the power to address the most challenging analyses. Our Enhanced Security™ (ES) UV WinLab software is designed for busy pharmaceutical, manufacturing, industrial, food, or academic laboratories in regulated environments that require compliance with US FDA 21 CFR Part 11 regulations.
Configurations
Part Number
Configuration
Detector Type
Wavelength Range*
L6020055
LAMBDA 1050+ with 2 Detector Module
Standard Detector
175 – 3300 nm
L6020087
LAMBDA 1050+ with 3 Detector Module (WB)
Standard Detector
175 – 3300 nm (enhanced performance InGaAs detector 900 – 2500 nm)
L6020086
LAMBDA 1050+ with 3 Detector Module (NB)
Standard Detector
175 – 3300 nm (enhanced performance InGaAs detector 900 – 1800 nm)
L6020114
LAMBDA 1050+ with 150 mm InGaAs Integrating Sphere
Integrating Sphere
190 – 2500 nm
L6020157
LAMBDA 1050+ with 100 mm InGaAs Integrating Sphere
Integrating Sphere
190 – 2500 nm
L6020159
LAMBDA 1050+ with 150 mm PbS Integrating Sphere
Integrating Sphere
190 – 2500 nm
L6020156
LAMBDA 1050+ with 100 mm PbS Integrating Sphere
Integrating Sphere
190 – 2500 nm
L6020179
LAMBDA 1050+ with UV/Vis/NIR URA
Universal Reflectance Accessory
185 – 3100nm†
L6020180
LAMBDA 1050+ with TAMS & Enhanced Silicon Direct Detector
Total Absolute Measurement System
190 – 1150 nm
L6020182
LAMBDA 1050+ with TAMS & Silicon/InGaAs Integrating Sphere Detector
Total Absolute Measurement System
200 – 2600 nm
L6020183
LAMBDA 1050+ with TAMS & Enhanced Silicon/InGaAs Integrating Sphere Detector
Total Absolute Measurement System
200 - 2500 nm
L6020184
LAMBDA 1050+ with TAMS & Enhanced Silicon/InGaAs Direct Detector
Total Absolute Measurement System
200 - 2500 nm
*Measurements below 190 nm require nitrogen purging of the instrument
† Wavelength range of the URA may be reduced when using a polarizer or depolarizer
