Perkin Elmer, N8152424, High Sensitivity SilQ Cyclonic Spray Chamber for NexION 1000/2000
This SilQ Baffled Cyclonic C3 High Sensitivity Spray Chamber is used with NexION® 1000 and 2000 ICP-MS series instruments. It is recommended for use in the NexION® 2000 Semiconductor Configuration and is an ideal all-purpose spray chamber for non-HF samples.
Catalog Number: N8152424
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