Merck, NIST614, Trace elements in glass

General description
A unit of SRM 614 comprises four wafers, each sliced to a thickness of 3 mm from a hand-pulled rod. The wafers have an ovalto circular cross-section, with a nominal diameter ranging from 12 mm to 14 mm.

SRM 614_cert

SRM 614_SDS
Application
The SRM is intended for use in the chemicalmethods employed to analyze trace elements in glass.
Features and Benefits
Accompanied with certified mass fraction values for each elements in trace elements in glass.
The reference and information values of elements are reported as mass fraction.
The NIST certificate is provided with expiration certificate, storage, safety, handling,use, and maintenance instructions.

Other Notes
Certified for the analytes listed below.
Copper (Cu), Lead (Pb), Potassium (K), Rubidium (Rb), Silver (Ag), Strontium (Sr), Thorium (Th), Uranium (U)

Reference/Informational value is provided for the following analytes.
Boron (B), Cobalt (Co), Europium (Eu), Iron (Fe), Lanthanum (La), Scandium (Sc), Thallium (Th), Titanium (Ti), Strontium (⁸⁷Sr/⁸⁶Sr), Antimony (Sb), Cadmium (Cd), Gallium (Ga), Gold (Au), Nickel (Ni), Uranium (²³⁵U/UTotal)

See certificate for values and more details at nist.gov/SRM.
Legal Information
NIST is a registered trademark of National Institute of Standards and Technology
SRM is a registered trademark of National Institute of Standards and Technology