| Accuracy | ±0.004 A at 1 A, ±0.004 A at 2 A, ±0.006A at 3 A |
|---|---|
| Baseline Flatness | ±0.0015 A, 200 to 800 nm, 2.0 nm SBW, smoothed |
| Certifications/Compliance | 21 CFR Part 11 and audit-proof IQ/OQ/PQ documentation. ISO 9001:2000 |
| Connections | RS-232 |
| Depth (English) | 21 in. |
| Depth (Metric) | 53 cm |
| Drift | <0.0005 A/hr., 500 nm, 2.0 nm SBW, 2 hr. warmup |
| Electrical Requirements | 100/240 V, 50/60 Hz |
| For Use With (Application) | Spectroscopy Elemental Isotope Analysis |
| Height (English) | 15 in. |
| Height (Metric) | 38 cm |
| Hertz | 50/60 Hz |
| Holds | Cuvettes up to 100 mm |
| Includes | VisionSecurity Software, User Guide and USB Cable |
| Interface | Computer Control |
| Lamp Life | >5 years or longer if not using live signal |
| Min. Data Interval | 0.5 nm |
| Monochromator | Modified Ebert |
| Noise | <p>Photometric:</p><p>0A: <0.00018 A</p><p>1A: <0.00022 A</p><p>2A: <0.00050 A</p><p>500 nm, 2.0 nm SBW, RMS</p> |
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| Optical Design |
|---|
| <p>Modified Ebert</p><p>Double beam with sample and reference cuvette/accessory positions</p> |
| Pharmacopoeia Compliance Testing | <p>Resolution (Toluene in Hexane): Peak/Trough Ratio >2.0</p><p>Photometric Accuracy (60mg/L K<sub>2</sub>Cr<sub>2</sub>O<sub>7</sub>): <±0.01 A relative to calibrated sealed standard</p><p>Stray Light: <0.13 %T at 198 nm with KCl per EP</p><p>220 nm: <0.01%T NaI (behaves identically to KI for USP)</p><p>Wavelength Accuracy: ±0.20 nm (546.11 nm Hg emission line), ±0.30 nm 190–900 nm</p><p>Wavelength Repeatability: Peak separation of repetitive scanning of Hg line source <0.10 nm</p> |
|---|
| Photometric Accuracy Including Standard Tolerance | <p>1A: ±0.008 A</p><p>2A: ±0.010 A</p><p>3A: ±0.018 A</p> |
|---|
| Photometric Display | ±6 A |
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| Photometric Range | >4A |
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| Photometric Readout | Absorbance, % Transmittance, % Reflectance, Concentration |
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| Photometric Repeatability | 1 A: ±0.0025 A |
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| Resolution (Toluene/Hexane) | Peak/Trough >2.0 at 0.5 nm SBW |
|---|
| Scan Ordinate Modes | Absorbance, % Transmittance, % Reflectance, Concentration,<br />1st-4th Derivative |
|---|
| Scan Speed | 1 to 3800 nm/min. |
|---|
| Stray Light | <p>198 nm: 2.9 A KCl</p><p>220 nm: 4.2 A NaI</p><p>340 nm: 4.3 A NaNO<sub>2</sub></p> |
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| System Requirements | At least Windows XP |
|---|
| Warranty | 3-year Source Replacement Warranty |
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| Wavelength Accuracy | ±0.20 nm (546.11 nm Hg emission line); ±0.3 nm for 190 to 900 nm |
|---|
| Wavelength Data Interval | 10, 5, 2, 1, 0.5, 0.2, 0.1, 0.05 nm |
|---|
| Wavelength Repeatability | Standard deviation of 10 measurements <0.05 nm |
|---|
| Weight (English) | 48.4 lb. |
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| Weight (Metric) | 22 kg |
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| Width (English) | 24 in. |
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| Width (Metric) | 61 cm |
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| Detector Type | Dual Matched Silicon Photodiodes |
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| Product Line | Evolution 300 |
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| Spectral Bandwidth | Variable 0.5; 1.0; 1.5; 2.0; 4.0 nm |
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| Type | 300 PC w/VisionPro Software |
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| Voltage | 100/240 V |
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| Wavelength Range | 190 to 1100 nm |
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| Unit Size | Each |
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