| Baseline Flatness | ±0.0015 A (200–800 nm) 2.0 nm SBW, smoothed |
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| Beam Center Height | 8.5 mm |
| Certifications/Compliance | Certificate of Analysis (COA), Certificate of Conformance (COC) |
| Dimensions (L x W x H) | 53 x 61 x 38 cm (20.8 x 24 x 14.9 in.) |
| Drift | <0.0005 A/hr., 500 nm, 2.0 nm SBW, 2 hr. warmup |
| Electrical Requirements | 100/240 V, 50/60 Hz |
| For Use With (Application) | Academic, Chemicals, Food & Beverage, Chemicals Environmental, Industrial QA/QC, Material Science, Pharmaceuticals |
| Lamp Life | >5 years or longer if not using live signal |
| Noise | Photometric<br />0A: <0.00018 A<br />1A: <0.00022 A<br />2A: <0.00050 A<br />500 nm, 2.0 nm SBW, RMS |
| Optical Design | Modified Ebert; Double beam with sample and reference cuvette/accessory positions |
| Pharmacopoeia Compliance Testing | Wavelength Accuracy: ±0.3 nm 190–900 nm<br />Wavelength Repeatability: SD 10 meas. <0.1 nm<br />Absorbance Accuracy: <±0.010A at 1A, <±0.010A at 2A<br />Absorbance Repeatability: ±0.0025A @ 1A<br />Stray Light: 198 nm with KCl >2A, 220 nm with NaI >3A, 300 nm with acetone >3A, 340 nm with NaNO2 >3A <br />Resolution: Peak/trough ratio >1.8 @ 1 nm SBW setting |
Unless otherwise stated, the minimum order amount is USD 1,000.
For orders below USD 1,000, an additional handling fee may apply, or we may arrange local delivery / local handover where available.
All quotations are subject to final confirmation, including product availability, lead time, batch information, shipping cost, and applicable export or handling requirements.
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| Photometric Accuracy | 1 A: ±0.004 A, 2 A: ±0.004 A, 3 A: ±0.006 A, Measured at 546 nm |
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| Photometric Display | ±6 A |
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| Photometric Range | >4 A |
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| Photometric Repeatability | 1 A: ±0.0025 A |
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| Scan Ordinate Modes | Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, Log(1/R), Log(Abs), ABS × Factor, Intensity, 1st–4th Derivative |
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| Scan Speed | Variable, up to 6000 nm/min. |
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| Stray Light | 198 nm: 2.4 A KCl<br />220 nm: 3.5 A NaI<br />340 nm: 4.0 A NaNO2<br /> |
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| Warranty | 3y Source Replacement Warranty |
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| Wavelength Accuracy | ±0.20 nm (546.11 nm Hg emission line), ±0.30 nm, 190 to 900 nm |
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| Wavelength Data Interval | 10, 5, 2, 1, 0.5, 0.2, 0.1, 0.05 nm |
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| Wavelength Repeatability | Standard deviation of 10 measurements <0.05 nm |
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| Weight (English) | 48.5 lb. |
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| Weight (Metric) | 22 kg |
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| Detector Type | Dual Matched Silicon Photodiodes |
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| Light Source | Xenon Flash/Mercury Vapor Lamp |
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| Product Line | Evolution 350 |
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| Spectral Bandwidth | 0.5, 1.0, 1.5, 2.0, 4.0 nm Selectable |
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| Type | UV-Vis Spec with Mercury Lamp |
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| Wavelength Range | 190 to 1100 nm |
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| Unit Size | Each |
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